% of High Severity Defects KPI

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Step 1: Add two data sources. The first, named ‘All defects,’ should cover all bugs. The second, ‘High Severity Defects,’ should exclusively include critical Bugs (in our case high and highest priority).

Step 2: Opt for the Formula metric type when configuring the metric.

Step 3: Progress to add two parameters essential for the Formula’s computation.

Step 4: Set the formula equation as (P2/P1)*100.

Step 5: To display the data per month on the x-axis, adjust the granularity of the ‘Created’ date field from ‘Week’ to ‘Month’ within the ‘Display by’ option.

Step 6: (Optional) Choose vertical orientation.

Step 7: Activate the Target section and ensure that the ‘Fixed’ tab remains selected.

Step 8: Set results to be evaluated per x-axis item. In the sample case the target will be calculated against each month shown on the x-axis.

Step 9: Set target value.

Step 10: Set the target as negative by choosing ‘Exceeding is: Bad’. This will cause values above the target to be perceived as negative, resulting in them being highlighted in red.

Step 11: (Optional) Within the ‘More Settings’ section, activate and set the ‘Warning threshold’. Consequently, values surpassing the threshold but falling below the target level will be colored in amber.

Step 12: (Optional) In the ‘More Settings’ section, enable the ‘Custom Target Label’ option and define it as text that signifies the negative target, such as “Max 8%”.

 

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Watch the video tutorial at our website: https://performance-objectives.com/of-high-severity-defects/

 

Additional instructions for Step 1: Performance Objectives: Charts for Jira supports various data segmentation options. You can conveniently filter specific filters, issue types, priority levels (as in our use case), resolution states, labels, or statuses to tailor your analysis precisely to your requirements.

Additional instruction for Step 3: In our scenario, we’ve selected “Number of Issues” for both Parameter 1 and Parameter 2. What’s crucial to note is that each parameter draws data from distinct sources. P1 utilizes data A (All Defects), whereas P2 utilizes data B (High Severity Defects).